Lateral force calibration of an atomic force microscope with a diamagnetic levitation spring system

Review of Scientific Instruments

Volumn 77, Issue 6, 2006, Pages

  Li, Q ^a   Kim, K S ^a   Rydberg, A ^a  

^a Brown University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPES; BIOMECHANICAL TESTING; GRAPHITE SHEETS; LATERAL FORCE CONSTANT;

ANISOTROPY; ATOMIC FORCE MICROSCOPY; CANTILEVER BEAMS; DIAMAGNETIC MATERIALS; FRICTION; SPRINGS (COMPONENTS);

MICROSCOPES;

EID: 33745728134     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2209953     Document Type: Article

References (19)

1. G. Binnig, C. F. Quate, and C. Berber, Phys. Rev. Lett. 56, 930 (1986).
2. C. M. Mate, G. M. McClelland, R. Erlandsson, and S. Chiang, Phys. Rev. Lett. 59, 1942 (1987).
3. R. W. Carpick, N. Agrait, D. F. Ogletree, and M. Salmeron, Langmuir 12, 3334 (1996).
4. D. F. Ogletree, R. W. Carpick, and M. Salmeron, Rev. Sci. Instrum. 67, 3298 (1996).
5. H. J. Butt, J. Colloid Interface Sci. 166, 109 (1994).
6. M. Kappl and H. J. Butt. Part. Part. Syst. Charact. 19, 129 (2002).
7. M. Varenberg, I. Etsion, and G. Halperin, Rev. Sci. Instrum. 74, 3362 (2003).
8. C. T. Gibson, G. S. Wastson, and S. Myhra, Wear 213, 72 (1997).
9. E. Liu, B. Blanpain, and J. P. Celis, Wear 192, 141 (1996).
10. R. J. Warmack, X. Y. Zheng, T. Thundat, and D. P. Allison, Rev. Sci. Instrum. 65, 394 (1994).
11. J. M. Neumeister and W. A. Ducker, Rev. Sci. Instrum. 65, 2527 (1994).
12. R. G. Cain, S. Biggs, and N. W. Page, J. Colloid Interface Sci. 227, 55 (2000).
13. G. Bogdanovic, A. Meurk, and M. W. Rutland, Colloids Surf., B 19, 397 (2000).
14. S. Jeon, Y. Braiman, and T. Thundat, Appl. Phys. Lett. 84, 1795 (2004).
15. R. G. Cain, M. G. Reitsma, S. Biggs, and N. W. Page, Rev. Sci. Instrum. 72, 3304 (2001).
16. J. D. Holbery, V. L. Eden, M. Sarikaya, and R. M. Fisher, Rev. Sci. Instrum. 71, 3769 (2000).
17. M. D. Simon and A. K. Geim, J. Appl. Phys. 87, 6200 (2000).
18. J. E. Sader, J. W. M. Chon, and P. Mulvaney, Rev. Sci. Instrum. 70, 3967 (1999).
19. Veeco Metrology, Santa Barbara, CA.