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Volumn 23, Issue 13, 2007, Pages 7078-7082

Calibration of friction force signals in atomic force microscopy in liquid media

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CALIBRATION; MATHEMATICAL MODELS; REFRACTIVE INDEX; TRIBOLOGY;

EID: 34547275280     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la070174v     Document Type: Article
Times cited : (29)

References (36)
  • 15
    • 36649037096 scopus 로고    scopus 로고
    • For recent reviews, see ref 4 and Schönherr, H, Vancso, G. J. In Scanning Probe Microscopies Beyond Imaging: Manipulation of Molecules and Nanostructures; Samori, P, Ed, Wiley-VCH: Weinheim, Germany, 2006; p 275
    • For recent reviews, see ref 4 and Schönherr, H.; Vancso, G. J. In Scanning Probe Microscopies Beyond Imaging: Manipulation of Molecules and Nanostructures; Samori, P., Ed.; Wiley-VCH: Weinheim, Germany, 2006; p 275.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.