Crosstalk problems in scanning-by-probe atomic force microscopy

Review of Scientific Instruments

Volumn 74, Issue 7, 2003, Pages 3569-3571

  Varenberg, M ^a   Etsion, I ^a   Halperin, G ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DIFFRACTION GRATINGS; FEEDBACK CONTROL;

TORSION SIGNALS;

CROSSTALK;

EID: 0042768119     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1581357     Document Type: Article

References (8)

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6. D. F. Ogletree, R. W. Carpick, and M. Salmeron, Rev. Sci. Instrum. 67, 3298 (1996).
7. R. Piner and R. S. Ruoff, Rev. Sci. Instrum. 73, 3392 (2002).
8. MikroMasch Eesti, Tallinn, Estonia.