Calibration of the torsional spring constant and the lateral photodiode response of frictional force microscopes

Review of Scientific Instruments

Volumn 71, Issue 7, 2000, Pages 2746-2750

  Feiler, Adam ^a   Attard, Phil ^a   Larson, Ian ^a  

^a UNIVERSITY OF SOUTH AUSTRALIA   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000691488     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1150686     Document Type: Article

References (19)

1. Y. Liu, T. Wu, and D. F. Evans, Langmuir 10, 2241 (1994).
2. Y. Liu, D. F. Evans, Q. Song, and D. W. Grainger, Langmuir 12, 1235 (1996).
3. E. Liu, B. Blanpain, and J. P. Celis, Wear 192, 141 (1996).
4. O. Pietrement, J. L. Beaudoin, and M. Troyon, Tribol. Lett. 7, 213 (2000).
5. R. Cain, S. Biggs, and N. Page, J. Colloid Interface Sci. (in press).
6. J. Neumeister and W. A. Ducker, Rev. Sci. Instrum. 65, 2527 (1994).
7. G. Toikka, R. A. Hayes, and J. Ralston, J. Adhes. Sci. Technol. 11, 1479 (1997).
8. G. Bodganovic, A. Meurk, and M. W. Rutland, Colloids Surf. B: Biointerfaces (in press).
9. A. Meurk, I. Larson, and L. Bergstrom, Mater. Res. Soc. Symp. Proc. 522, 427 (1998).
10. J. Ruan and B. Bhushan, ASME J. Tribol. 116, 378 (1994).
11. H. Klein, D. Pailharey, and Y. Mathey, Surf. Sci. 387, 227 (1997).
12. P. Attard, A. Carrambassis, and M. W. Rutland, Langmuir 15, 553 (1999).
13. D. F. Ogletree, R. W. Carpick, and M. Salmeron, Rev. Sci. Instrum. 67, 3298 (1996).
14. J. P. Cleveland, S. Manne, D. Bocek, and P. K. Hansma, Rev. Sci. Instrum. 64, 402 (1993).
15. The sensitivity of the piezo used in our experiments was found to vary as a function of its extension. This nonlinearity, which we characterized by interference measurements, causes the slope of the compliance regions to vary with the amount of piezo extension (i.e., the nominal drive distance differs from the actual drive distance by an amount that depends upon the starting position of the drive). To minimize this error it is best to conduct all experiments and calibrations at the same piezo extension when possible.
16. D. A. Ducker, T. J. Senden, and R. M. Pashley, Langmuir 8, 1831 (1992).
17. -9 N/m.
18. The lateral voltage signal should be monitored even in a normal force measurement to confirm that the probe is attached on the axis and that the cantilever is not twisting.
19. For the L = 109 μm case, there was an adhesion between the lever and the substrate, which results in different slopes for ΔVvert and ΔVlat for the inward and outward runs. The average of the two runs gives an accurate value for γ.