Comparison of friction measurements using the atomic force microscope and the surface forces apparatus: The issue of scale

Tribology Letters

Volumn 10, Issue 4, 2001, Pages 217-223

  McGuiggan, Patricia M ^a   Zhang, Jun ^a,b   Hsu, Stephen M ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b DATA STORAGE INSTITUTE   (Singapore)

Author keywords

Atomic force microscope; Friction; Friction of thin films; Scale; Surface forces apparatus; Tribology

Indexed keywords

EID: 0011635987     PISSN: 10238883     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1016692704748     Document Type: Article

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