Improved parallel scan method for nanofriction force measurement with atomic force microscopy

Review of Scientific Instruments

Volumn 78, Issue 3, 2007, Pages

  Wang, Yu Liang ^a   Zhao, Xue Zeng ^a   Zhou, Fa Quan ^a  

^a HARBIN INSTITUTE OF TECHNOLOGY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DEFLECTION (STRUCTURES); FRICTION; MATERIALS PROPERTIES; NANOCANTILEVERS;

FRICTION COEFFICIENT; MICROFRICTION FORCE; NANOFRICTION FORCE MEASUREMENT;

FORCE MEASUREMENT;

ARTICLE; ATOMIC FORCE MICROSCOPY; METHODOLOGY; NANOTECHNOLOGY;

MICROSCOPY, ATOMIC FORCE; NANOTECHNOLOGY;

EID: 34047179486     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2712789     Document Type: Article

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