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Volumn 11, Issue 12, 1997, Pages 1479-1489

The application of lateral force microscopy to particle removal in aqueous polymer solutions

Author keywords

Adhesion; Atomic force microscopy; Dispersants; Friction; Iron oxide; Lateral force microscopy; Particle removal; Polymer solutions; Silica

Indexed keywords

ADHESION; FRICTION; IRON OXIDES; SILICA; ATOMIC FORCE MICROSCOPY; POLYMER SOLUTIONS; SHEAR FLOW; SILICON WAFERS; SPHERES;

EID: 0031360747     PISSN: 01694243     EISSN: 15685616     Source Type: Journal    
DOI: 10.1163/156856197X00381     Document Type: Article
Times cited : (29)

References (25)
  • 13


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.