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Volumn 11, Issue 12, 1997, Pages 1479-1489
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The application of lateral force microscopy to particle removal in aqueous polymer solutions
a
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Author keywords
Adhesion; Atomic force microscopy; Dispersants; Friction; Iron oxide; Lateral force microscopy; Particle removal; Polymer solutions; Silica
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Indexed keywords
ADHESION;
FRICTION;
IRON OXIDES;
SILICA;
ATOMIC FORCE MICROSCOPY;
POLYMER SOLUTIONS;
SHEAR FLOW;
SILICON WAFERS;
SPHERES;
DISPERSANTS;
LATERAL FORCE MICROSCOPY;
PARTICLE REMOVAL;
ATOMIC FORCE MICROSCOPY;
CHEMICALS REMOVAL (WATER TREATMENT);
AFM;
AFM CANTILEVERS;
AQUEOUS POLYMER SOLUTIONS;
ATOMIC FORCE;
ATOMIC FORCE MICROSCOPES;
DISPERSANT CONCENTRATION;
DISPERSANTS;
LATERAL FORCE;
LATERAL FORCE MICROSCOPY;
LOADING FORCE;
PARTICLE REMOVAL;
PULL-OFF FORCES;
SHEAR FORCE;
SPRING CONSTANTS;
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EID: 0031360747
PISSN: 01694243
EISSN: 15685616
Source Type: Journal
DOI: 10.1163/156856197X00381 Document Type: Article |
Times cited : (29)
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References (25)
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