Torsional spring constant obtained for an atomic force microscope cantilever

Applied Physics Letters

Volumn 84, Issue 10, 2004, Pages 1795-1797

  Jeon, Sangmin ^a   Braiman, Yehuda ^a   Thundat, Thomas ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC FIELD EFFECTS; FRICTION; LASER BEAMS; MAGNETOMETERS; MATHEMATICAL MODELS; NATURAL FREQUENCIES;

LORENTZ FORCES; TORSIONAL SPRING CONSTANTS;

CANTILEVER BEAMS;

EID: 1842528868     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1667000     Document Type: Article

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