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Volumn 103, Issue 14, 2013, Pages

Evaluation of potential variations around grain boundaries in BaSi 2 epitaxial films by Kelvin probe force microscopy

(9) Baba, Masakazu a Tsurekawa, Sadahiro b Watanabe, Kentaro a Du, W a Toko, Kaoru a Hara, Kosuke O c Usami, Noritaka c,d Sekiguchi, Takashi e Suemasu, Takashi a,d

a UNIVERSITY OF TSUKUBA (Japan)

b KUMAMOTO UNIVERSITY (Japan)

c NAGOYA UNIVERSITY (Japan)

d JAPAN SCIENCE AND TECHNOLOGY AGENCY (Japan)

e NATIONAL INSTITUTE FOR MATERIALS SCIENCE (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BARIUM COMPOUNDS; CHARGE CARRIERS; EPITAXIAL FILMS; GRAIN BOUNDARIES; SILICON;

BARRIER HEIGHTS; CHARGE CARRIER RECOMBINATION; KELVIN PROBE FORCE MICROSCOPY; PHOTOGENERATED HOLES; POTENTIAL VARIATIONS; SI (1 1 1); SI(0 0 1);

SILICON COMPOUNDS;

EID: 84885581387 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.4824335 Document Type: Article

Times cited : (27)

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