Reevaluation of the beneficial effect of Cu(In,Ga)Se 2 grain boundaries using Kelvin probe force microscopy

Applied Physics Letters

Volumn 100, Issue 20, 2012, Pages

  Zhang, Zhenhao ^a,b   Tang, Xiaochen ^a,b   Kiowski, Oliver ^c   Hetterich, Michael ^a   Lemmer, Uli ^a   Powalla, Michael ^a,c   Hölscher, Hendrik ^b  

^a KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

^b KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

^c ZENTRUM FÜR SONNENENERGIE UND WASSERSTOFF FORSCHUNG BADEN WÜRTTEMBERG ZSW   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BENEFICIAL EFFECTS; CROSS SECTION; CU(IN , GA)SE; KELVIN PROBE FORCE MICROSCOPY; POTENTIAL VARIATIONS;

GALLIUM; PROBES;

GRAIN BOUNDARIES;

EID: 84861793206     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4714905     Document Type: Article

References (29)

1. P. Jackson, D. Hariskos, E. Lotter, S. Paetel, R. Wuerz, R. Menner, W. Wischmann, and M. Powalla, Prog. Photovoltaics 19, 894 (2011). 10.1002/pip.1078
2. S. Niki, M. Contreras, I. Repins, M. Powalla, K. Kushiya, S. Ishizuka, and K. Matsubara, Prog. Photovoltaics 18, 453 (2010). 10.1002/pip.969
3. U. Rau, K. Taretto, and S. Siebentritt, Appl. Phys. A 96, 221 (2009). 10.1007/s00339-008-4978-0
4. C. Lei, C. M. Li, A. Rockett, and I. M. Robertson, J. Appl. Phys. 101, 024909 (2007). 10.1063/1.2426962
5. M. J. Hetzer, Y. M. Strzhemechny, M. Gao, M. A. Contreras, A. Zunger, and L. J. Brillson, Appl. Phys. Lett. 86, 162105 (2005). 10.1063/1.1906331
6. M. J. Romero, K. Ramanathan, M. A. Contreras, M. M. Al-Jassim, R. Noufi, and P. Sheldon, Appl. Phys. Lett. 83, 4770 (2003). 10.1063/1.1631083
7. D. Abou-Ras, J. Dietrich, J. Kavalakkatt, M. Nichterwitz, S. S. Schmidt, C. T. Koch, R. Caballero, J. Klaer, and T. Rissom, Sol. Energy Mater. Sol. Cells 95, 1452 (2011). 10.1016/j.solmat.2010.11.008
8. M. Nonnenmacher, M. P. O'Boyle, and H. K. Wickramasinghe, Appl. Phys. Lett. 58, 2921 (1991). 10.1063/1.105227
9. C.-S. Jiang, R. Noufi, K. Ramanathan, J. A. AbuShama, H. R. Moutinho, and M. M. Al-Jassim, Appl. Phys. Lett. 85, 2625 (2004). 10.1063/1.1793346
10. J. B. Li, V. Chawla, and B. M. Clemens, Adv. Mater. 24, 720 (2012). 10.1002/adma.201103470
11. G. Hanna, T. Glatzel, S. Sadewasser, N. Ott, H. P. Strunk, U. Rau, and J. H. Werner, Appl. Phys. A 82, 1 (2006). 10.1007/s00339-005-3411-1
12. Y. Yan, C.-S. Jiang, R. Noufi, S.-H. Wei, H. R. Moutinho, and M. M. Al-Jassim, Phys. Rev. Lett. 99, 235504 (2007). 10.1103/PhysRevLett.99.235504
13. S. Siebentritt, S. Sadewasser, M. Wimmer, C. Leendertz, T. Eisenbarth, and M. C. Lux-Steiner, Phys. Rev. Lett. 97, 146601 (2006). 10.1103/PhysRevLett. 97.146601
14. D. Schmid, M. Ruckh, F. Grunwald, and H. W. Schock, J. Appl. Phys. 73, 2902 (1993). 10.1063/1.353020
15. T. Glatzel, D. F. Marrón, T. Schedel-Niedrig, S. Sadewasser, and M. C. Lux-Steiner, Appl. Phys. Lett. 81, 2017 (2002). 10.1063/1.1506205
16. T. Glatzel, H. Steigert, S. Sadewasser, R. Klenk, and M. C. Lux-Steiner, Thin Solid Films 480-481, 177 (2005). 10.1016/j.tsf.2004.11.065
17. R. Mainz, F. Streicher, D. Abou-Ras, S. Sadewasser, R. Klenk, and M. C. Lux-Steiner, Phys. Status Solidi A 206, 1017 (2009). 10.1002/pssa.200881216
18. Z.-H. Zhang, X.-C. Tang, U. Lemmer, W. Witte, O. Kiowski, M. Powalla, and H. Hölscher, Appl. Phys. Lett. 99, 042111 (2011). 10.1063/1.3607954
19. M. Powalla, G. Voorwinden, D. Hariskos, P. Jackson, and R. Kniese, Thin Solid Films 517, 2111 (2009). 10.1016/j.tsf.2008.10.126
20. D. Liao and A. Rockett, J. Appl. Phys. 93, 9380 (2003). 10.1063/1.1570500
21. D. Ziegler, J. Rychen, N. Naujoks, and A. Stemmer, Nanotechnology 18, 225505 (2007). 10.1088/0957-4484/18/22/225505
22. C.-S. Jiang, R. Noufi, K. Ramanathan, H. R. Moutinho, and M. M. Al-Jassim, J. Appl. Phys. 97, 053701 (2005). 10.1063/1.1856217
23. H. Sugimura, Y. Ishida, K. Hayashi, and O. Takai, Appl. Phys. Lett. 80, 1459 (2002). 10.1063/1.1455145
24. R. Baier, D. Abou-Ras, T. Rissom, and M. C. Lux-Steiner, Appl. Phys. Lett. 99, 172102 (2011). 10.1063/1.3652915
25. A. Klein and W. Jaegermann, Appl. Phys. Lett. 74, 2283 (1999). 10.1063/1.123825
26. See supplemental material at http://dx.doi.org/10.1063/1.4714905 E-APPLAB-100-084220 for several examples.
27. T. Dullweber, O. Lundberg, J. Malmström, M. Bodegard, L. Stolt, U. Rau, H. W. Schock, and J. H. Werner, Thin Solid Films 387, 11 (2001). 10.1016/S0040-6090(00)01726-0
28. S. Sadewasser, T. Glatzel, M. Rusu, A. Jäger-Waldau, and M. C. Lux-Steiner, Appl. Phys. Lett. 80, 2979 (2002). 10.1063/1.1471375
29. Grain Boundaries in Semiconductors, edited by, H. Leamy, G. Pike, and, C. Seager, (North-Holland, New York, 1982).