Infrared optical properties of amorphous and nanocrystalline Ta 2O5 thin films

Journal of Applied Physics

Volumn 114, Issue 8, 2013, Pages

  Bright, T J ^a   Watjen, J I ^a   Zhang, Z M ^a   Muratore, C ^b,c   Voevodin, A A ^b   Koukis, D I ^d   Tanner, D B ^d   Arenas, D J ^e  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

^b AIR FORCE RESEARCH LABORATORY   (United States)

^c University of Dayton   (United States)

^d University of Florida   (United States)

^e UNIVERSITY OF NORTH FLORIDA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BACKGROUND ABSORPTION; EFFECTIVE MEDIUM APPROXIMATION; FOURIER TRANSFORM INFRA REDS; INFRARED OPTICAL PROPERTIES; LORENTZ OSCILLATOR; REACTIVE MAGNETRON SPUTTERING; TRANSMITTANCE AND REFLECTANCES; VISIBLE AND NEAR INFRARED;

ATOMIC FORCE MICROSCOPY; SCANNING ELECTRON MICROSCOPY; TANTALUM OXIDES; X RAY DIFFRACTION;

AMORPHOUS FILMS;

EID: 84883883689     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4819325     Document Type: Article

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