Change in radiative optical properties of Ta2O5 thin films due to high-temperature heat treatment

Journal of Heat Transfer

Volumn 129, Issue 1, 2007, Pages 27-36

  Chandrasekharan, Ramesh ^a   Prakash, Shaurya ^a   Shannon, Mark A ^a   Masel, R I ^b  

^a University of Illinois at Urbana Champaign   (United States)

^b UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

High temperature; Infrared reflectance; Interfacial layer; Optical constants

Indexed keywords

FOURIER TRANSFORM INFRARED SPECTROSCOPY; HEAT TREATMENT; HIGH TEMPERATURE EFFECTS; OPTICAL PROPERTIES; OPTIMIZATION; REFLECTION; REFLECTOMETERS;

AUGER DEPTH PROFILING; OPTICAL ADMITTANCE ALGORITHM;

THIN FILMS;

FOURIER TRANSFORM INFRARED SPECTROSCOPY; HEAT TREATMENT; HIGH TEMPERATURE EFFECTS; OPTICAL PROPERTIES; OPTIMIZATION; REFLECTION; REFLECTOMETERS; THIN FILMS;

EID: 34248343857     PISSN: 00221481     EISSN: None     Source Type: Journal    
DOI: 10.1115/1.2401195     Document Type: Article

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