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Volumn 89, Issue 9, 2001, Pages 4836-4842

X-ray reflectivity of self-assembled structures in SiGe multilayers and comparison with atomic force microscopy

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0035340479     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1359156     Document Type: Article
Times cited : (8)

References (17)
  • 12
    • 0347916415 scopus 로고    scopus 로고
    • unpublished
    • S. Stepanov (unpublished); see http://sergey.bio.aps.anl. gov
    • Stepanov, S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.