Coplanar and grazing incidence x-ray-diffraction investigation of self-organized SiGe quantum dot multilayers

Physical Review B - Condensed Matter and Materials Physics

Volumn 58, Issue 12, 1998, Pages 7934-7943

  Holy V ^a   Darhuber, A ^a   Stangl, J ^a   Zerlauth, S ^a   Schaffler F ^a   Bauer, G ^a   Darowski, N ^b   Lubbert D ^b   Pietsch, U ^b  

^a JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

^b UNIVERSITY OF POTSDAM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84877294104     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.58.7934     Document Type: Article

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