X-ray diffraction from quantum wires and quantum dots

Journal of Materials Science: Materials in Electronics

Volumn 10, Issue 3, 1999, Pages 215-221

  Zhuang, Y ^a   Stangl, J ^a   Darhuber, A A ^a   Bauer, G ^a   Mikulik P ^b   Holy V ^b   Darowski, N ^c   Pietsch, U ^c  

^a JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

^b MASARYK UNIVERSITY   (Czech Republic)

^c UNIVERSITY OF POTSDAM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTING SILICON; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR QUANTUM DOTS; SEMICONDUCTOR QUANTUM WIRES; SEMICONDUCTOR SUPERLATTICES; STRAIN; X RAY CRYSTALLOGRAPHY; X RAY SCATTERING;

STRAIN DISTRIBUTION;

NANOSTRUCTURED MATERIALS;

EID: 0032690691     PISSN: 09574522     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1008952113611     Document Type: Article

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