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Volumn 13, Issue 6, 2013, Pages 2598-2604

Spatially resolved correlation of active and total doping concentrations in VLS grown nanowires

Author keywords

doping; Kelvin probe force microscopy; nanoprobe scanning Auger microscopy; Nanowires; VLS

Indexed keywords

DEVICE PERFORMANCE; DOPING CONCENTRATION; ELECTRICAL JUNCTIONS; KELVIN PROBE FORCE MICROSCOPY; RADIALLY INHOMOGENEOUS; SCANNING AUGER MICROSCOPY; SPATIALLY RESOLVED; VLS;

EID: 84879123359     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl4007062     Document Type: Article
Times cited : (40)

References (50)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.