SCOPUS 정보 검색 플랫폼

Volumn 95, Issue 9, 2009, Pages

Nonuniform doping distribution along silicon nanowires measured by Kelvin probe force microscopy and scanning photocurrent microscopy

(5) Koren, E a Rosenwaks, Y a Allen, J E b Hemesath, E R b Lauhon, L J b

a TEL AVIV UNIVERSITY (Israel)

b Northwestern University (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DOPANT DISTRIBUTION; DOPED SILICON; DOPING DISTRIBUTION; DOPING VARIATION; KELVIN PROBE FORCE MICROSCOPY; NON-UNIFORM DOPING; NONLINEAR POTENTIAL; SILICON NANOWIRES; VAPOR-LIQUID-SOLID METHODS;

ELECTRIC WIRE; NANOWIRES; PHOSPHORUS; PHOTOCURRENTS; PROBES; SCANNING;

DOPING (ADDITIVES);

EID: 69949149832 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3207887 Document Type: Article

Times cited : (85)

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