Nonuniform nanowire doping profiles revealed by quantitative scanning photocurrent microscopy

Advanced Materials

Volumn 21, Issue 30, 2009, Pages 3067-3072

  Allen, Jonathan E ^a   Perea, Daniel E ^a   Hemesath, Eric R ^a   Lauhon, Lincoln J ^a  

^a Northwestern University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONFOCAL MICROSCOPES; DOPING DENSITIES; DOPING PROFILES; HIGH SPATIAL RESOLUTION; KELVIN PROBE FORCE MICROSCOPY; NANOWIRE DEVICES; NONUNIFORM; SCANNING STAGES; SENSITIVITY GRADIENTS; SI NANOWIRE; SURFACE DOPING; TRANSPORT CHARACTERISTICS; WIRE LENGTH;

CARRIER CONCENTRATION; DOPING (ADDITIVES); ELECTRIC WIRE; NANOWIRES; PHOSPHORUS; PHOTOCURRENTS; SCANNING; SURFACES;

SURFACE ANALYSIS;

EID: 69249087276     PISSN: 09359648     EISSN: None     Source Type: Journal    
DOI: 10.1002/adma.200803865     Document Type: Article

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