Sub-surface imaging of carbon nanotube-polymer composites using dynamic AFM methods

Nanotechnology

Volumn 24, Issue 13, 2013, Pages

  Cadena, Maria J ^a   Misiego, Rocio ^b   Smith, Kyle C ^b   Avila, Alba ^a   Pipes, Byron ^b   Reifenberger, Ron ^b   Raman, Arvind ^b  

^a UNIVERSIDAD DE LOS ANDES   (Colombia)

^b PURDUE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON NANOTUBE-POLYMER COMPOSITES; CARBONNANOTUBE NETWORK (CNT); CONDUCTIVITY PERCOLATION; ELECTRICAL CHARACTERIZATION; ELECTROSTATIC FORCE MICROSCOPY; KELVIN PROBE FORCE MICROSCOPY; NANOSTRUCTURED COMPOSITES; SINGLE WALLED NANOTUBE (SWNTS);

ATOMIC FORCE MICROSCOPY; DISPERSIONS; ELECTRIC FORCE MICROSCOPY; NANOCOMPOSITES; POLYIMIDES; PROBES; SOLVENTS;

CARBON NANOTUBES;

CARBON NANOTUBE; POLYMER;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; COMPUTER ASSISTED DIAGNOSIS; CONFORMATION; MACROMOLECULE; MATERIALS TESTING; METHODOLOGY; PARTICLE SIZE; SURFACE PROPERTY; ULTRASTRUCTURE;

IMAGE INTERPRETATION, COMPUTER-ASSISTED; MACROMOLECULAR SUBSTANCES; MATERIALS TESTING; MICROSCOPY, ATOMIC FORCE; MOLECULAR CONFORMATION; NANOTUBES, CARBON; PARTICLE SIZE; POLYMERS; SURFACE PROPERTIES;

EID: 84875204044     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/24/13/135706     Document Type: Article

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