Single-pass Kelvin force microscopy and dC/dZ measurements in the intermittent contact: Applications to polymer materials

Beilstein Journal of Nanotechnology

Volumn 2, Issue 1, 2011, Pages 15-27

  Magonov, Sergei ^a   Alexander, John ^a  

^a AGILENT TECHNOLOGIES   (United States)

Author keywords

Atomic force microscopy; Fluoroalkanes; KELVIN force microscopy; Surface potential

Indexed keywords

COMPOSITIONAL MAPPING; FLUOROALKANES; FORCE GRADIENTS; HETEROGENEOUS POLYMERS; HUMID AIR; IN-SITU; INTERMITTENT-CONTACTS; KELVIN FORCE MICROSCOPY; METAL ALLOYS; MULTICOMPONENTS; NANO-METER-SCALE; ORGANIC VAPORS; POLYMER MATERIALS; POLYMER SYSTEMS; SENSITIVE DETECTION; SPATIAL RESOLUTION;

ATOMIC FORCE MICROSCOPY; CAPACITANCE; SURFACE POTENTIAL; SURFACE PROPERTIES; SWELLING;

POLYMERS;

EID: 79952426348     PISSN: None     EISSN: None     Source Type: Journal    
DOI: 10.3762/bjnano.2.2     Document Type: Article

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