Quantifying the dielectric constant of thick insulators using electrostatic force microscopy

Applied Physics Letters

Volumn 96, Issue 18, 2010, Pages

  Fumagalli, L ^a,b   Gramse, G ^a,b   Esteban Ferrer, D ^a   Edwards, M A ^a   Gomila, G ^a,b  

^a INSTITUTE FOR BIOENGINEERING OF CATALONIA IBEC   (Spain)

^b UNIVERSITY OF BARCELONA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC CONSTANTS; DIELECTRIC-AIR INTERFACES; ELECTROSTATIC FORCE MICROSCOPY; FINITE-ELEMENT CALCULATIONS; LENGTH SCALE; LOW FREQUENCY; MUSCOVITE MICA; NANO SCALE; NANOMETRICS; POLY(ETHYLENE NAPHTHALATE); PROBE GEOMETRY; QUANTITATIVE MEASUREMENT; SUBSTRATE THICKNESS; TRUNCATED CONE;

ELECTRIC FORCE MICROSCOPY; ELECTROSTATIC DEVICES; ELECTROSTATIC FORCE; ESTERS; ETHYLENE; MICA; PERMITTIVITY; SILICATE MINERALS; THICKNESS MEASUREMENT;

BOROSILICATE GLASS;

EID: 77952875068     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3427362     Document Type: Article

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