Quantifying the dielectric constant of thick insulators by electrostatic force microscopy: Effects of the microscopic parts of the probe

Nanotechnology

Volumn 23, Issue 20, 2012, Pages

  Gramse, G ^a,b   Gomila, G ^a,b   Fumagalli, L ^a,b  

^a INSTITUTE FOR BIOENGINEERING OF CATALONIA IBEC   (Spain)

^b UNIVERSITY OF BARCELONA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROSTATIC FORCE MICROSCOPY; GENERAL METHODOLOGIES; INSULATING SUBSTRATES; LOCAL DIELECTRIC CONSTANT; SYSTEMATIC ANALYSIS; TIP APEX;

ELECTRIC FORCE MICROSCOPY; NANOCANTILEVERS; PROBES;

ELECTROSTATIC FORCE;

NANOPARTICLE;

ARTICLE; ARTIFACT; ATOMIC FORCE MICROSCOPY; CHEMISTRY; CONDUCTOMETRY; ELECTRIC CONDUCTIVITY; EQUIPMENT; EQUIPMENT DESIGN; INSTRUMENTATION; MATERIALS TESTING; STATIC ELECTRICITY; TRANSDUCER; ULTRASTRUCTURE;

ARTIFACTS; CONDUCTOMETRY; ELECTRIC CONDUCTIVITY; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; MATERIALS TESTING; MICROSCOPY, ATOMIC FORCE; NANOPARTICLES; STATIC ELECTRICITY; TRANSDUCERS;

EID: 84860523092     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/23/20/205703     Document Type: Article

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