Mapping of individual carbon nanotubes in polymer/nanotube composites using electrostatic force microscopy

Applied Physics Letters

Volumn 90, Issue 18, 2007, Pages

  Jespersen, Thomas Sand ^a   Nygard, Jesper ^a  

^a UNIVERSITY OF COPENHAGEN   (Denmark)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROSTATIC FORCE; POLYMER MATRIX; POLYMETHYL METHACRYLATES; THREE DIMENSIONAL;

EFM AMPLITUDE; ELECTROSTATIC FORCE MICROSCOPY; NONINVASIVE TOOLS; SPIN CAST POLYMERS;

SINGLE-WALLED CARBON NANOTUBES (SWCN);

EID: 34247877789     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2734920     Document Type: Article

References (13)

1. P. Ajayan, O. Stephan, C. Colliex, and D. Trauth, Science 265, 1212 (1994).
2. M. Moniruzzaman and K. Winey, Macromolecules 39, 5194 (2006).
3. V. Bliznyuk, S. Singamaneni, R. Kattumenu, and M. Atashbar, Appl. Phys. Lett. 88, 164101 (2006).
4. J. Foster, S. Singamaneni, R. Kattumenu, and V. Bliznyuk, J. Colloid Interface Sci. 287, 167 (2005).
5. C. Stephan, T. Nguyen, M. de la Chapelle, S. Lefrant, C. Journet, and P. Bernier, Synth. Met. 108, 139 (2000).
6. Z. Jia, Z. Wang, C. Xu, J. Liang, B. Wei, D. Wu, and S. Zhu, Mater. Sci. Eng., A 271, 395 (1999).
7. M. Bockrath, N. Markovic, A. Shepard, M. Tinkham, L. Gurevich, L. Kouwenhoven, M. Wu, and L. Sohn, Nano Lett. 2, 187 (2002).
8. C. Staii, A. Johnson, and N. Pinto, Nano Lett. 4, 859 (2004).
9. SCM-PIT cantilevers from Veeco Instruments, www.veeco.com.
10. T. Jespersen and J. Nygard, Nano Lett. 5, 1838 (2005).
11. S. Kalinin, D. Bonnell, M. Freitag, and A. Johnson, Appl. Phys. Lett. 81, 754 (2002).
12. N. Wilson and J. Macpherson, J. Appl. Phys. 96, 3565 (2004).
13. G. Sacha, C. Gómez-Navarro, J. Sáenz, and J. Gómez-Herrero, Appl. Phys. Lett. 89, 173122 (2006).