Multifrequency atomic force microscopy: Compositional imaging with electrostatic force measurements

Microscopy and Microanalysis

Volumn 17, Issue 4, 2011, Pages 587-597

  Magonov, Sergei ^a,b   Alexander, John ^a,b  

^a AGILENT TECHNOLOGIES   (United States)

^b NT MDT Development Inc   (United States)

Author keywords

atomic force microscopy; electric force microscopy; fluoroalkanes; frequency modulation; Kelvin force microscopy

Indexed keywords

EID: 80054881167     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927611000122     Document Type: Article

References (32)

1. Alexander, J., Magonov, S. & Moeller, M. (2009).Topography and surface potential in Kelvin force microscopy of perfluoro-alkyl alkane self-assemblies. J Vac Sci Technol B 27, 903-911.
2. Ando, H., Yoshizaki, T., Aoki, A. & Yamakawa, H. (1997). Mean-square electric dipole moment ofoligo-and poly(methyl methacrylate) in dilute solution. Macromolecules 30, 6199-6207. (Pubitemid 127574390)
3. Belikov, S., Erina, N. & Magonov, S. (2007). Interplay between an experiment and theory in probing mechanical properties and phase imaging of heterogeneous polymer materials. JPhys ConfSer 6, 765-769.
4. Belikov, S. & Magonov, S. (2006). True molecular-scale imaging in atomic force microscopy: Experiment and modeling. Jpn J Appl Phys 45, 2158-2165.
5. Broniatowski, M., Minores, J., Jr. & Dynarowicz-Latka, P. (2004). Semifluorinated chains in 2D-(per-fluorododecyl)-alkanes at the air/water interface. J Colloid Interf Sci 279, 552-558. (Pubitemid 39349455)
6. Cleveland, J., Anczykowski, B., Schmid, A.E. & Elings, V.B. (1998). Energy dissipation in tapping-mode atomic force microscopy. Appl Phys Lett 72, 2613-2615. (Pubitemid 128671593)
7. Colchero, J., Gil, A. & Baro, A.M. (2001). Resolution enhancement and improved data interpretation in electrostatic force microscopy. Phys Rev B 64, 245403-245414.
8. Crider, P.S., Majewski, M.R., Zhang, J., Oukris, H. & Israe-loff, N.E. (2008). Local dielectric spectroscopy of near-surface glassy polymer dynamics. J Chem Phys 128, 044908-5.
9. El Abed, A., Faure, M.-C., Pouzet, E. & Abilon, O. (2002). Experimental evidence for an original two-dimensional phase structure: An antiparallel semifluorinated monolayer at the air-water interface. Phys Rev E 5, 051603-051606.
10. Elings, V.B. & Gurley, J.A. (1994). Scanning probe microscope using stored data for vertical probe positioning. US Patent 5, 308, 974.
11. Fujihira, M. (1999). Kelvin probe force microscopy of molecular surfaces. Ann Rev Mater Sci 29, 353-380.
12. Fukuma, T., Kimura, M., Kobayashi, K., Matsushige, K. & Yamada, H. (2005). Development of low noise cantilever deflection sensor for multienvironment frequency-modulation atomic force microscopy. Rev Sci Instrum 76, 1-8. (Pubitemid 40666036)
13. Fumagalli, L., Gramse, G., Esteban-Ferrer, D., Edwards, M.A. & Gomilla, G. (2010). Quantifying the dielectric constant of thick insulators using electrostatic force microscopy. Appl Phys Lett 96, 183107-183109.
14. Gramse, G., Casuso, I., Toset, J., Fumagalli, L. & Gomila, G. (2009). Quantitative dielectric constant measurement of thin films by DC electrostatic force microscopy. Nanotechnology 20, 395702-395709.
15. Kim, J.-J., Jung, S.-D. & Hwang, W.-Y. (1996). Molecular conformation and application of stereoregular PMMA Langmuir-Blodgett films. ETRIJ 18, 195-206.
16. Krayev, A.V. & Talroze, R.V. (2004). Electric force microscopy of dielectric heterogeneous polymer blends. Polymer 45, 8195-8200. (Pubitemid 39457686)
17. Krok, F., Sajewicz, K., Konior, J.M., Goryl, M., Piatkowski, P. & Szymonski, M. (2008). Lateral resolution and potential sensitivity in Kelvin probe force microscopy; Towards understanding of the sub-nanometer resolution. Phys Rev B 77, 235427-235435.
18. Labardi, M., Prevosto, D., Nguyen, K.H., Capaccioli, S., Luc-chesi, M. & Rolla, P. (2010). Local dielectric spectroscopy of nanocomposites materials interfaces. J Vac Sci Technol B 28, C4D11-C4D17.
19. Magonov, S. (2000). AFM in analysis of polymers. In Encyclopedia of Analytical Chemistry, Meyers, R.A. (Ed.), pp. 7432-7491. Chichester, UK: John Willey & Sons Ltd.
20. Magonov, S. & Alexander, J. (2008). Advanced atomic force microscopy: Exploring measurements of local electric properties. Application Note 5989-9740EN. Chandler, AZ: Agilent Technologies, Inc.
21. Magonov, S. & Alexander, J. (2010). Compositional imaging of materials with single-pass Kelvin force microscopy. Application Note 5990-0000EN. Chandler, AZ: Agilent Technologies, Inc.
22. Magonov, S., Alexander, J., Jeong, S.-H. & Kotov, N. (2010). High-resolution imaging of molecular and nanoparticles assemblies with Kevin force microscopy. J Nanosci Nanotech 10, 1-5.
23. Magonov, S., Alexander, J. & Wu, S. (2011). Advancing characterization of materials with Atomic force microscopy based electric techniques. In Scanning Probe Microscopy ofFunctional Materials: Nanoscale Imaging and Spectroscopy, Kalinin, S. & Gruverman, A. (Eds.), pp. 233-300. New York: Springer.
24. Magonov, S. & Mesa, B. (2007). Novel diamond/sapphire probes for scanning probe microscopy applications. J Phys ConfSer 6, 770-774.
25. Martin, Y., Abraham, D.A. & Wickramasinghe, H.K. (1988). High-resolution capacitance measurement and potentiometry by force microscopy. Appl Phys Lett 52, 1103-10005.
26. Riedel, C., Arinero, R., Tordjeman, Ph., Leveque, G., Schwartz, G.A., Alegria, A. & Colmenero, J. (2010a). Nanodielectric mapping of model polystyrene-Poly (vinyl acetate) blend by electrostatic force microscopy. Phys Rev E 81, 010801-010804.
27. Riedel, C., Sweeney, R., Israeloff, N.E., Arinero, R., Schwartz, G.A., Alegria, A., Tordjeman, Ph. & Colmenero, J. (2010b). Imaging dielectric relaxation in nanostructured polymers by frequency modulation electrostatic force microscopy. Appl Phys Lett 96, 213110-213112.
28. Salmeron, M. (2001). Scanning polarization force microscopy. Oil Gas Sci Technol 56, 63-75.
29. Stockmayer, W.H. (1967). Dielectric dispersion in solutions of flexible polymers. Pure Appl Chem 15, 539-554.
30. Tanaka, K., Fujii, Y., Atarashi, H., Akabori, K., Hono, M. & Na-gamura, T. (2008). Nonsolvents cause swelling at the interface with poly(methyl methacrylate) films. Langmuir 24, 296-301.
31. Zerweck, U., Loppacher, Ch., Otto, T., Grafstroem, S. & Eng, L.M. (2005). Accuracy and resolution limits of Kelvin probe force microscopy. Phys Rev B 71, 125424-125433.
32. Zhang, Q.M., Bharti, V., Kavarnos, G. & Schwartz, M. (Ed.) (2002). Poly (vinylidene fluoride)(PVDF) and its copolymers. In Encyclopedia of Smart Materials, Volumes 1-2, pp. 807-825. New York: John Wiley & Sons.