Subsurface imaging of carbon nanotube networks in polymers with DC-biased multifrequency dynamic atomic force microscopy

Nanotechnology

Volumn 24, Issue 13, 2013, Pages

  Thompson, Hank T ^a   Barroso Bujans, Fabienne ^b   Herrero, Julio Gomez ^c   Reifenberger, Ron ^a   Raman, Arvind ^a  

^a PURDUE UNIVERSITY   (United States)

^b INSTITUTO DE CIENCIA Y TECNOLOGÍA DE POLÍMEROS   (Spain)

^c UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLITUDE MODULATION AFM; CARBON NANOTUBE NETWORK; CARBONNANOTUBE NETWORK (CNT); DUAL-FREQUENCY EXCITATION; DYNAMIC ATOMIC FORCE MICROSCOPY; ORGANIC PHOTOVOLTAICS; POLYMER NANOCOMPOSITE; SUB-SURFACE IMAGING;

ATOMIC FORCE MICROSCOPY; CAPACITANCE; CARBON NANOTUBES; ELECTROLYTIC CAPACITORS; ENERGY DISSIPATION; NANOCOMPOSITES;

AMPLITUDE MODULATION;

CARBON NANOTUBE; POLYMER;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; COMPUTER ASSISTED DIAGNOSIS; CONFORMATION; MACROMOLECULE; MATERIALS TESTING; METHODOLOGY; PARTICLE SIZE; SURFACE PROPERTY; ULTRASTRUCTURE;

IMAGE INTERPRETATION, COMPUTER-ASSISTED; MACROMOLECULAR SUBSTANCES; MATERIALS TESTING; MICROSCOPY, ATOMIC FORCE; MOLECULAR CONFORMATION; NANOTUBES, CARBON; PARTICLE SIZE; POLYMERS; SURFACE PROPERTIES;

EID: 84875132314     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/24/13/135701     Document Type: Article

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