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Volumn 33, Issue 2, 2002, Pages 146-150

Fabrication of a ring nanoelectrode in an AFM tip: Novel approach towards simultaneous electrochemical and topographical imaging

(4) Lugstein, Alois a Bertagnolli, Emmerich a Kranz, Christine a,b Mizaikoff, Boris b

a VIENNA UNIVERSITY OF TECHNOLOGY (Austria)

b GEORGIA INSTITUTE OF TECHNOLOGY (United States)

Author keywords

Atomic force microscopy (AFM); Focused ion beam (FIB); Micromachining; Ring nanoelectrode; Scanning electrochemical microscopy (SECM)

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTROCHEMISTRY; ELECTRODES; FABRICATION; IMAGING TECHNIQUES; ION BEAMS; MICROMACHINING; MICROSCOPIC EXAMINATION; NANOSTRUCTURED MATERIALS;

FOCUSED ION BEAM; RING NANOELECTRODE; SCANNING ELECTROCHEMICAL MICROSCOPY;

SURFACE TOPOGRAPHY;

EID: 0036471051 PISSN: 01422421 EISSN: None Source Type: Journal
DOI: 10.1002/sia.1178 Document Type: Article

Times cited : (44)

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