Spatially-resolved electroluminescence of operating organic light-emitting diodes using conductive atomic force microscopy

Applied Physics Letters

Volumn 85, Issue 2, 2004, Pages 344-346

  Pingree, L S C ^a   Hersam, M C ^a   Kern, M M ^b   Scott, B J ^b   Marks, T J ^b  

^a Northwestern University   (United States)

^b NORTHWESTERN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ORGANIC LIGHT EMITTING DIODES (OLED); PHOTOMULTIPLIER TUBE; RESISTIVITY VARIATIONS; SEMICONDUCTING NANOWIRES;

ELECTRIC CURRENTS; ELECTRIC POTENTIAL; ELECTRIC PROPERTIES; ELECTROLUMINESCENCE; FABRICATION; LIGHT EMITTING DIODES; NANOTUBES; OPTICAL PROPERTIES; OPTOELECTRONIC DEVICES; PHOTOMULTIPLIERS; TOPOLOGY;

ATOMIC FORCE MICROSCOPY;

EID: 3242877127     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1765206     Document Type: Article

References (28)

1. C. W. Tang and S. A. VanSlyke, Appl. Phys. Lett. 51, 913 (1987).
2. J. A. Rogers, Z. Bao, K. Baldwin, A. Dodabalapur, B. Crone, V. R. Raju, V. Kuck, H. Katz, K. Amundson, J. Ewing, and P. Drzaic, Proc. Natl. Acad. Sci. U.S.A. 98, 4835 (2001).
3. J. G. C. Veinot, H. Yan, S. M. Smith, J. Cui, Q. Huang, and T. J. Marks, Nano Lett. 2, 333 (2002).
4. L. S. Hung and C. H. Chen, Mater. Sci. Eng., R. 39, 143 (2002).
5. M. Fujihira, L.-M. Do, A. Koike, and E.-M. Han, Appl. Phys. Lett. 68, 1787 (1996).
6. J. McElvain, H. Antoniadis, M. R. Hueschen, J. N. Miller, D. M. Roitman, J. R. Sheats, and R. L. Moon, J. Appl. Phys. 80, 6002 (1996).
7. H. Aziz, Z. Popovic, C. P. Tripp, N.-X. Hu, A.-M. Hor, and G. Xu, Appl. Phys. Lett. 72, 2642 (1998).
8. Y.-F. Liew, H. Aziz, N.-X. Hu, H. S.-O. Chan, G. Xu, and Z. Popovic, Appl. Phys. Lett. 77, 2650 (2000).
9. D. Kolosov, D. S. English, V. Bulovic, P. F. Barbara, S. R. Forrest, and M. E. Thompson, J. Appl. Phys. 90, 3242 (2001).
10. M. Fujihira, M. Sakomura, D. Aoki, and A. Koike, Thin Solid Films 273, 168 (1996).
11. M. Fujihira, H. Monobe, A. Koike, G. R. Ivanov, H. Muramatsu, N. Chiba, N. Yamamoto, and T. Ataka, Ultramicroscopy 71, 269 (1998).
12. N. Yamamoto, H. Muramatsu, L.-M. Do, E.-M. Han, T. Kato, and M. Fujihira, J. Microsc. 202, 395 (2001).
13. G. M. Credo and S. K. Buratto, Adv. Mater. (Weinheim, Ger.) 12, 183 (2000).
14. G. M. Credo, D. L. Winn, and S. K. Buratto, Chem. Mater. 13, 1258 (2001).
15. M. C. Hersam, A. C. F. Hoole, S. J. O'Shea, and M. E. Weiland, Appl. Phys. Lett. 72, 915 (1998).
16. P. De Wolf, W. Vandervorst, H. Smith, and N. Khalil, J. Vac. Sci. Technol. B 18, 540 (2000).
17. A. M. Rawlett, T. J. Hopson, L. A. Nagahara, R. K. Tsui, G. K. Ramachandran, and S. M. Lindsay, Appl. Phys. Lett. 81, 3043 (2002).
18. J. Planès, F. Houzé, P. Chrétien, and O. Schneegans, Appl. Phys. Lett. 79, 2993 (2001).
19. H.-N. Lin, H.-L. Lin, S.-S. Wang, L.-S. Yu, G.-Y. Perng, S.-A. Chen, and S.-H. Chen, Appl. Phys. Lett. 81, 2572 (2002).
20. H.-N. Lin, S.-H. Chen, Y.-Z. Lee, and S.-A. Chen, J. Vac. Sci. Technol. B 19, 308 (2001).
21. F. Charra, S. Bouchel, O. Plessis, J.-M. Nunzi, P. Raimond, C. Denis, and E. Gautier-Thianche, Opt. Mater. (Amsterdam, Neth.) 12, 249 (1999).
22. S. F. Alvarado, L. Rossi, P. Müller, P. F. Seidler, and W. Riess, IBM J. Res. Dev. 45, 89 (2001).
23. Ph. Niedermann, W. Hänni, N. Blanc, R. Christoph, and J. Burger, J. Vac. Sci. Technol. A 14, 1233 (1996).
24. W. J. Li, Q. W. Wang, J. Cui, H. Chou, S. E. Shaheen, G. E. Jabbour, J. Anderson, P. Lee, B. Kippelen, N. Peyghambarian, N. R. Armstrong, and T. J. Marks, Adv. Mater. (Weinheim, Ger.) 11, 730 (1999).
25. J. Cui, Q. Huang, J. C. G. Veinot, H. Yan, Q. Wang, G. R. Hutchison, A. G. Richter, G. Evmenenko, P. Dutta, and T. J. Marks, Langmuir 18, 9958 (2002).
26. M. E. Thompson, P. E. Burrows, and S. R. Forrest, Curr. Opin. Solid State Mater. Sci. 4, 369 (1999).
27. J. Cui, Q. Huang, Q. Wang, and T. J. Marks, Langmuir 17, 2051 (2001).
28. M. Hiramoto, T. Miyao, and M. Yokoyama, Appl. Phys. Lett. 57, 1625 (1990).