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Volumn 69, Issue 13, 1996, Pages 1975-1977
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Imaging the local electrical properties of metal surfaces by atomic force microscopy with conducting probes
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0001135829
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.117179 Document Type: Article |
Times cited : (171)
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References (17)
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