Imaging the local electrical properties of metal surfaces by atomic force microscopy with conducting probes

Applied Physics Letters

Volumn 69, Issue 13, 1996, Pages 1975-1977

  Houze F ^a   Meyer, R ^a   Schneegans, O ^a   Boyer, L ^a  

^a CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001135829     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.117179     Document Type: Article

References (17)

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