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Volumn 69, Issue 13, 1996, Pages 1975-1977

Imaging the local electrical properties of metal surfaces by atomic force microscopy with conducting probes

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[No Author keywords available]

Indexed keywords


EID: 0001135829     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.117179     Document Type: Article
Times cited : (171)

References (17)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.