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Applied Physics Letters

Volumn 81, Issue 2, 2002, Pages 349-351

Integrating micro- and nanoelectrodes into atomic force microscopy cantilevers using focused ion beam techniques

(5) Lugstein, A a Bertagnolli, E a Kranz, C b Kueng, A b Mizaikoff, B b

a VIENNA UNIVERSITY OF TECHNOLOGY (Austria)

b GEORGIA INSTITUTE OF TECHNOLOGY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY CANTILEVERS; ATOMIC FORCE MICROSCOPY TIPS; ELECTROCHEMICAL MEASUREMENTS; ELECTROCHEMICAL RESPONSE; FOCUSED ION BEAM TECHNIQUE; MODEL SURFACE; NANO-ELECTRODES; POROUS POLYMERS; SAMPLE SURFACE; SCANNING PROBES; WORKING DISTANCES;

ATOMIC FORCE MICROSCOPY; ELECTROCHEMISTRY; FOCUSED ION BEAMS; FUNCTIONAL POLYMERS;

SURFACE TOPOGRAPHY;

EID: 79956057883 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.1492304 Document Type: Article

Times cited : (53)

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