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Volumn 27, Issue 22, 2011, Pages 13925-13930

Parylene insulated probes for scanning electrochemical-atomic force microscopy

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVE ELECTRODES; CONDUCTIVE AFM; ELECTROCHEMICAL ACTIVITIES; ELECTROCHEMICAL PHENOMENA; IN-SITU; IN-SITU MEASUREMENT; INSULATING LAYERS; MECHANICAL ABRASION; PARYLENES; POROUS MEMBRANES; PROBE TIPS; SCANNING ELECTROCHEMICAL-ATOMIC FORCE MICROSCOPIES;

EID: 80755161490     PISSN: 07437463     EISSN: 15205827     Source Type: Journal    
DOI: 10.1021/la203032u     Document Type: Article
Times cited : (37)

References (55)
  • 52
    • 84858445382 scopus 로고    scopus 로고
    • http://gwyddion.net/.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.