Nanoscale electrical property studies of individual GeSi quantum rings by conductive scanning probe microscopy

Nanoscale Research Letters

Volumn 7, Issue , 2012, Pages

  Lv, Yi ^a   Cui, Jian ^a   Jiang, Zuimin M ^a   Yang, Xinju ^a  

^a FUDAN UNIVERSITY   (China)

Author keywords

CAFM; Electrical properties; GeSi quantum rings (QRs); SCM; SKM

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC PROPERTIES; HYDROPHOBICITY; NANORINGS; SCANNING PROBE MICROSCOPY; SURFACE POTENTIAL; WORK FUNCTION;

CAFM; CONDUCTANCE DISTRIBUTION; CONDUCTIVE ATOMIC FORCE MICROSCOPY; DENSITY DISTRIBUTIONS; QUANTUM RING; SCANNING CAPACITANCE MICROSCOPY; SURFACE POTENTIAL DISTRIBUTIONS; WORK FUNCTION DISTRIBUTIONS;

SI-GE ALLOYS;

EID: 84871217566     PISSN: 19317573     EISSN: 1556276X     Source Type: Journal    
DOI: 10.1186/1556-276X-7-659     Document Type: Article

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