Layer-dependent nanoscale electrical properties of graphene studied by conductive scanning probe microscopy

Nanoscale Research Letters

Volumn 6, Issue , 2011, Pages 1-6

  Zhao, Shihua ^a   Lv, Yi ^a   Yang, Xinju ^a  

^a FUDAN UNIVERSITY   (China)

Author keywords

electrostatic force microscopy; graphene; layer dependence; quantum capacitance; scanning capacitance microscopy

Indexed keywords

BI-LAYER; ELECTROSTATIC FORCE MICROSCOPY; GATE VOLTAGES; LAYER DEPENDENCE; LAYER NUMBER; NANO SCALE; QUANTUM CAPACITANCE; SAMPLE BIAS; SCANNING CAPACITANCE MICROSCOPY; SINGLE LAYER;

BIAS VOLTAGE; CAPACITANCE; ELECTRONIC STRUCTURE; ELECTROSTATIC DEVICES; ELECTROSTATIC FORCE; GRAPHENE; NANOTECHNOLOGY; PHASE SHIFT; PHASE SHIFTERS; SCANNING PROBE MICROSCOPY; SILICON COMPOUNDS; SURFACE POTENTIAL;

ELECTRIC FORCE MICROSCOPY;

EID: 84862908684     PISSN: 19317573     EISSN: 1556276X     Source Type: Journal    
DOI: 10.1186/1556-276X-6-498     Document Type: Article

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