Scanning tunneling spectroscopy and Kelvin probe force microscopy investigation of Fermi energy level pinning mechanism on InAs and InGaAs clean surfaces

Journal of Applied Physics

Volumn 108, Issue 2, 2010, Pages

  Melitz, Wilhelm ^a   Shen, Jian ^a   Lee, Sangyeob ^a   Lee, Joon Sung ^a   Kummel, Andrew C ^a   Droopad, Ravi ^b   Yu, Edward T ^c  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b TEXAS STATE UNIVERSITY   (United States)

^c The University of Texas at Austin   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CLEAN SURFACES; CLEAVED SURFACES; FERMI ENERGY LEVELS; FERMI LEVEL PINNING; FLAT BAND; INAS; KELVIN PROBE FORCE MICROSCOPY; PINNING MECHANISM; SCANNING TUNNELING SPECTROSCOPY; STATIC CHARGE;

ELECTRONIC STRUCTURE; FERMI LEVEL; PROBES; SCANNING TUNNELING MICROSCOPY; SPECTROSCOPY; VACUUM;

SEMICONDUCTING INDIUM;

EID: 77955820002     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3462440     Document Type: Article

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