메뉴 건너뛰기




Volumn 110, Issue 9, 2011, Pages

Electrical properties of individual self-assembled GeSi quantum rings

Author keywords

[No Author keywords available]

Indexed keywords

AFM OBSERVATION; CHEMICAL ETCHING; COMPLETE OXIDATION; COMPOSITION DISTRIBUTIONS; CONDUCTIVE ATOMIC FORCE MICROSCOPY; CURRENT DISTRIBUTION; ELECTROSTATIC FORCE MICROSCOPY; GE CONTENT; HIGH CONDUCTIVITY; LOW CONDUCTIVITY; NANO SCALE; QUANTUM RING; ROOM TEMPERATURE; SCANNING CAPACITANCE MICROSCOPY; SELF-ASSEMBLED;

EID: 81355132299     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3658816     Document Type: Article
Times cited : (4)

References (25)
  • 1
    • 33846876769 scopus 로고    scopus 로고
    • Properties and applications of quantum dot heterostructures grown by molecular beam epitaxy
    • DOI 10.1007/s11671-006-9017-5
    • M. Henini, Nanoscale Res. Lett. 1, 32 (2006). 10.1007/s11671-006-9017-5 (Pubitemid 46226232)
    • (2006) Nanoscale Research Letters , vol.1 , Issue.1 , pp. 32-45
    • Henini, M.1
  • 2
    • 34848854753 scopus 로고    scopus 로고
    • Electron tunneling from quantum dots characterized by deep level transient spectroscopy
    • DOI 10.1063/1.2790846
    • O. Engstrm, M. Kaniewska, M. Kaczmarczyk, and W. Jung, Appl. Phys. Lett. 91, 133117 (2007). 10.1063/1.2790846 (Pubitemid 47502618)
    • (2007) Applied Physics Letters , vol.91 , Issue.13 , pp. 133117
    • Engstrom, O.1    Kaniewska, M.2    Kaczmarczyk, M.3    Jung, W.4
  • 4
    • 47749122624 scopus 로고    scopus 로고
    • 10.1088/0034-4885/71/7/076501
    • R. A. Oliver, Rep. Prog. Phys. 71, 076501 (2008). 10.1088/0034-4885/71/7/ 076501
    • (2008) Rep. Prog. Phys. , vol.71 , pp. 076501
    • Oliver, R.A.1
  • 8
    • 25444493569 scopus 로고    scopus 로고
    • Studying the lateral composition in Ge quantum dots on Si(0 0 1) by conductive atomic force microscopy
    • DOI 10.1016/j.susc.2005.06.082, PII S0039602805007983
    • F. Xue, J. Qin, J. Cui, Y. L. Fan, Z. M. Jiang, and X. J. Yang, Surf. Sci. 592, 65 (2005). 10.1016/j.susc.2005.06.082 (Pubitemid 41375616)
    • (2005) Surface Science , vol.592 , Issue.1-3 , pp. 65-71
    • Xue, F.1    Qin, J.2    Cui, J.3    Fan, Y.L.4    Jiang, Z.M.5    Yang, X.J.6
  • 9
    • 33748697231 scopus 로고    scopus 로고
    • Imaging the electric properties of InAs/InP(001) quantum dots capped with a thin InP layer by conductive atomic force microscopy: Evidence of memory effect
    • DOI 10.1063/1.2349288
    • K. Smaali, M. Troyon, A. E. Hdiy, M. Molinari, G. Saint-Girons, and G. Patriarche, Appl. Phys. Lett. 89, 112115 (2006). 10.1063/1.2349288 (Pubitemid 44396586)
    • (2006) Applied Physics Letters , vol.89 , Issue.11 , pp. 112115
    • Smaali, K.1    Troyon, M.2    El Hdiy, A.3    Molinari, M.4    Saint-Girons, G.5    Patriarche, G.6
  • 10
    • 33749506056 scopus 로고    scopus 로고
    • Effects of a native oxide layer on the conductive atomic force microscopy measurements of self-assembled Ge quantum dots
    • DOI 10.1088/0957-4484/17/20/012, PII S0957448406283338, 012
    • R. Wu, F. H. Li, Z. M. Jiang, and X. J. Yang, Nanotechnology 17, 5111 (2006). 10.1088/0957-4484/17/20/012 (Pubitemid 44523720)
    • (2006) Nanotechnology , vol.17 , Issue.20 , pp. 5111-5116
    • Wu, R.1    Li, F.H.2    Jiang, Z.M.3    Yang, X.J.4
  • 18
    • 44949222446 scopus 로고    scopus 로고
    • Influence of electron irradiation on the electronic transport mechanisms during the conductive AFM imaging of InAs/GaAs quantum dots capped with a thin GaAs layer
    • DOI 10.1088/0957-4484/19/25/255709, PII S0957448408716957
    • M. Troyon and K. Smaali, Nanotechnology 19, 255709 (2008). 10.1088/0957-4484/19/25/255709 (Pubitemid 351813718)
    • (2008) Nanotechnology , vol.19 , Issue.25 , pp. 255709
    • Troyon, M.1    Smaali, K.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.