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Journal of Applied Physics

Volumn 107, Issue 6, 2010, Pages

Frequency dependent capacitance spectroscopy using conductive diamond tips on GaAs/ Al2 O3 junctions

(6) Eckhardt, C a Silvano De Sousa, J a Brezna, W a Bethge, O a Bertagnolli, E a Smoliner, J a

a VIENNA UNIVERSITY OF TECHNOLOGY (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTIC APPROACH; CAPACITANCE-VOLTAGE CURVE; CONDUCTIVE DIAMONDS; FREQUENCY BEHAVIOR; FREQUENCY-DEPENDENT CAPACITANCE; GAAS; HIGH FREQUENCY; LOW FREQUENCY; LOW FREQUENCY BEHAVIOR; MINORITY CARRIER CONCENTRATION; NANO SCALE; SCANNING CAPACITANCE; TIP GEOMETRY; TRANSITION FREQUENCIES; TWO-DIMENSIONAL SIMULATIONS;

ALUMINUM; CARRIER CONCENTRATION;

CAPACITANCE;

EID: 77950590602 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3354030 Document Type: Conference Paper

Times cited : (2)

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