Imaging and probing electronic properties of self-assembled InAs quantum dots by atomic force microscopy with conductive tip

Applied Physics Letters

Volumn 74, Issue 6, 1999, Pages 844-846

  Tanaka, Ichiro ^a,b,d   Kamiya, I ^a,b   Sakaki, H ^a,b   Qureshi, N ^c   Allen Jr , S J ^c   Petroff, P M ^c  

^a JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^b UNIVERSITY OF TOKYO   (Japan)

^c UNIVERSITY OF CALIFORNIA   (United States)

^d WAKAYAMA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001642537     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.123402     Document Type: Article

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