Conductive atomic force microscopy of InAsGaAs quantum rings

Applied Physics Letters

Volumn 92, Issue 19, 2008, Pages

  Mlakar, Tomaž ^a   Biasiol, Giorgio ^a   Heun, Stefan ^b   Sorba, Lucia ^a,b   Vijaykumar, T ^c   Kulkarni, G U ^c   Spreafico, Vittorio ^d   Prato, Stefano ^d  

^a LABORATORIO TASC   (Italy)

^b CNR   (Italy)

^c JAWAHARLAL NEHRU CENTRE FOR ADVANCED SCIENTIFIC RESEARCH   (India)

^d Area Science Park   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CONDUCTIVITY; SELF ASSEMBLED MONOLAYERS; SEMICONDUCTING INDIUM GALLIUM ARSENIDE; TWO DIMENSIONAL;

CURRENT MAPS; QUANTUM RINGS; SURFACE OXIDES;

SEMICONDUCTOR QUANTUM DOTS;

EID: 44049099958     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2928220     Document Type: Article

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