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Volumn 37, Issue 10, 2012, Pages 943-951

Scanning transmission electron microscopy: Seeing the atoms more clearly

Author keywords

atomic arrangements; chemical composition; defects; electron energy loss spectroscopy (EELS); Scanning transmission electron microscopy (STEM)

Indexed keywords

ATOMIC ARRANGEMENT; ATOMIC COLUMNS; ATOMIC NUMBERS; CHEMICAL COMPOSITIONS; HIGHER RESOLUTION; LORD RAYLEIGH; OPTICAL MICROSCOPES; PHASE-CONTRAST IMAGE; SCANNING TRANSMISSION ELECTRON MICROSCOPES; SCANNING TRANSMISSION ELECTRON MICROSCOPY; TWO-DIMENSIONAL MATERIALS; Z-CONTRAST IMAGES;

EID: 84867375997     PISSN: 08837694     EISSN: None     Source Type: Journal    
DOI: 10.1557/mrs.2012.239     Document Type: Article
Times cited : (10)

References (89)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.