STEM-EELS imaging of complex oxides and interfaces

MRS Bulletin

Volumn 37, Issue 1, 2012, Pages 29-35

  Varela, Maria ^a   Gazquez, Jaume ^b   Pennycook, Stephen J ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b INSTITUT DE CIÈNCIA DE MATERIALS DE BARCELONA ICMAB CSIC   (Spain)

Author keywords

electron energy loss spectroscopy (EELS); Oxide; scanning transmission electron microscopy (STEM); thin film

Indexed keywords

ATOMIC RESOLUTION; COMPLEX OXIDES; ELEMENTAL MAPPING; FUTURE APPLICATIONS; HIGH-T; LOW-DIMENSIONAL SYSTEMS; MAGNETIC ATOMS; MATERIALS SCIENTIST; OXIDE INTERFACES; OXIDE MATERIALS; REAL SYSTEMS; REAL-SPACE; SCANNING TRANSMISSION ELECTRON MICROSCOPY (STEM); SINGLE ATOMS; SPHERICAL ABERRATIONS; SPIN STATE; STEM-EELS; SYSTEM PROPERTY;

ATOMIC SPECTROSCOPY; ATOMS; COLOSSAL MAGNETORESISTANCE; ELECTRIC RESISTANCE; ELECTRONS; INTERFACES (MATERIALS); NANOWIRES; OXIDES; POINT DEFECTS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRON ENERGY LOSS SPECTROSCOPY;

EID: 84855821996     PISSN: 08837694     EISSN: None     Source Type: Journal    
DOI: 10.1557/mrs.2011.330     Document Type: Article

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