Towards atomic scale engineering of rare-earth-doped SiAlON ceramics through aberration-corrected scanning transmission electron microscopy

Scripta Materialia

Volumn 65, Issue 8, 2011, Pages 656-659

  Yurdakul, Hilmi ^a,b   Idrobo, Juan C ^b,c   Pennycook, Stephen J ^b,c   Turan, Servet ^a  

^a ANADOLU UNIVERSITY   (Turkey)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

^c VANDERBILT UNIVERSITY   (United States)

Author keywords

Ceramics; Rare earth; Scanning transmission electron microscope (STEM); SiAlON; Z contrast microscopy

Indexed keywords

ATOMIC SCALE ENGINEERING; CERAMICS; DIRECT VISUALIZATION; HEXAGONAL SITES; RARE EARTH DOPED MATERIALS; SCANNING TRANSMISSION ELECTRON MICROSCOPE (STEM); SCANNING TRANSMISSION ELECTRON MICROSCOPES; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SIALON; SIALON CERAMICS; UNIT CELLS; Z-CONTRAST IMAGING; Z-CONTRAST MICROSCOPY;

ATOMS; CERAMIC MATERIALS; CERIUM; ELECTRON MICROSCOPES; IMAGING TECHNIQUES; RARE EARTHS; SCANNING; VISUALIZATION; YTTERBIUM;

TRANSMISSION ELECTRON MICROSCOPY;

EID: 80052267472     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.scriptamat.2011.06.038     Document Type: Article

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