On the method of photoluminescence spectral intensity ratio imaging of silicon bricks: Advances and limitations

Journal of Applied Physics

Volumn 112, Issue 6, 2012, Pages

  Mitchell, Bernhard ^a   Weber, Jürgen W ^b   Walter, Daniel ^c   MacDonald, Daniel ^c   Trupke, Thorsten ^a,b  

^a UNIVERSITY OF NEW SOUTH WALES   (Australia)

^b BT Imaging   (Australia)

^c AUSTRALIAN NATIONAL UNIVERSITY   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

BULK LIFETIME; COMPREHENSIVE STUDIES; DARK NOISE; EXPOSURE TIME; IMAGE BLUR; IMAGE CONTRASTS; IMAGE DECONVOLUTION; INGAAS CAMERA; OPTICAL LIGHT; PHOTOLUMINESCENCE IMAGING; PHOTOLUMINESCENCE MEASUREMENTS; SPECTRAL INTENSITY; SUBBANDS;

BRICK; PHOTOLUMINESCENCE;

SILICON WAFERS;

EID: 84867042563     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4752409     Document Type: Article

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