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Volumn 106, Issue 11, 2009, Pages

Combined dynamic and steady-state infrared camera based carrier lifetime imaging of silicon wafers

Author keywords

[No Author keywords available]

Indexed keywords

DYNAMIC EVALUATION; EXCITATION SOURCES; FREE CARRIER DENSITY; INFRA-RED CAMERAS; INFRARED EMISSIONS; LIFETIME MAPPING; ROUGH SURFACES; SIGNAL RATIOS; SPATIALLY RESOLVED; STEADY-STATE CONDITION; TECHNICAL REQUIREMENT;

EID: 72449166950     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3261733     Document Type: Article
Times cited : (27)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.