Micro-photoluminescence spectroscopy on metal precipitates in silicon

Physica Status Solidi - Rapid Research Letters

Volumn 3, Issue 7-8, 2009, Pages 230-232

  Gundel, Paul ^a   Schubert, Martin C ^a   Kwapil, Wolfram ^a   Schön, Jonas ^b   Reiche, Manfred ^c   Savin, Hele ^d   Yli Koski, Marko ^d   Sans, Juan Angel ^e   Martinez Criado, Gema ^e   Seifert, Winfried ^f   Warta, Wilhelm ^a   Weber, Eicke R ^a  

^a FRAUNHOFER INSTITUTE FOR SOLAR ENERGY SYSTEMS ISE   (Germany)

^b UNIVERSITY OF FREIBURG   (Germany)

^c MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

^d AALTO UNIVERSITY   (Finland)

^e EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^f BRANDENBURG UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BONDED WAFERS; COPPER PRECIPITATE; DEFECT LUMINESCENCE; METAL PRECIPITATES; METALLIC IMPURITY; MICROPHOTOLUMINESCENCE SPECTROSCOPY; MINORITY CARRIER; MULTI-CRYSTALLINE SILICON SOLAR CELLS; SILICON DEVICES; SPECIFIC EFFECTS; X RAY FLUORESCENCE SPECTROSCOPY;

DEFECT DENSITY; DEFECTS; FLUORESCENCE SPECTROSCOPY; LIGHT EMISSION; PHOTOLUMINESCENCE; PHOTOLUMINESCENCE SPECTROSCOPY; POLYSILICON; SILICON SOLAR CELLS;

SILICON WAFERS;

EID: 71149112338     PISSN: 18626254     EISSN: 18626270     Source Type: Journal    
DOI: 10.1002/pssr.200903221     Document Type: Article

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