Quantitative carrier lifetime images optically measured on rough silicon wafers

Journal of Applied Physics

Volumn 101, Issue 12, 2007, Pages

  Schubert, Martin C ^a   Pingel, Sebastian ^b   The, Manuel ^b   Warta, Wilhelm ^b  

^a UNIVERSITY OF FREIBURG   (Germany)

^b FRAUNHOFER INSTITUTE FOR SOLAR ENERGY SYSTEMS ISE   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DECONVOLUTION; FILTRATION; SILICON WAFERS;

BLURRING; CARRIER LIFETIME IMAGES; EMISSIVITY; SPATIAL DISTRIBUTION; TEXTURED SURFACES;

CARRIER LIFETIME;

EID: 34547242529     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2748867     Document Type: Article

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