Contactless measurement of minority carrier lifetime in silicon ingots and bricks

Progress in Photovoltaics: Research and Applications

Volumn 19, Issue 3, 2011, Pages 313-319

  Swirhun, James S ^a   Sinton, Ronald A ^a   Forsyth, M Keith ^a   Mankad, Tanaya ^a  

^a Sinton Consulting Inc   (United States)

Author keywords

carrier lifetime; multicrystalline; QSSPC; silicon; solar cell; wafer

Indexed keywords

BULK LIFETIME; BULK SAMPLES; CONTACTLESS MEASUREMENT; MEASUREMENT DATA; MINORITY CARRIER LIFETIMES; MULTICRYSTALLINE; PHOTOCONDUCTANCE; QSSPC; QUASI-STEADY STATE; SILICON INGOT; SURFACE RECOMBINATION VELOCITIES; WAFER;

INGOTS; POWER QUALITY; SEMICONDUCTING SILICON COMPOUNDS; SILICON WAFERS; SOLAR CELLS;

CARRIER LIFETIME;

EID: 79953651083     PISSN: 10627995     EISSN: 1099159X     Source Type: Journal    
DOI: 10.1002/pip.1029     Document Type: Article

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