Diffusion lengths of silicon solar cells from luminescence images

Journal of Applied Physics

Volumn 101, Issue 12, 2007, Pages

  Wurfel P ^a,c   Trupke, T ^a   Puzzer, T ^a   Schaffer E ^b   Warta, W ^b   Glunz, S W ^b  

^a UNIVERSITY OF NEW SOUTH WALES   (Australia)

^b FRAUNHOFER INSTITUTE FOR SOLAR ENERGY SYSTEMS ISE   (Germany)

^c UNIVERSITY OF KARLSRUHE   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFUSION LENGTHS; ELECTROLUMINESCENCE MEASUREMENTS; LUMINESCENCE IMAGES; SPECTRAL FILTERS;

DIFFUSION; ELECTROLUMINESCENCE; IMAGE ANALYSIS; PHOTOLUMINESCENCE; SILICON WAFERS; SURFACE DEFECTS;

SILICON SOLAR CELLS;

EID: 34547326879     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2749201     Document Type: Article

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