Imaging of metal impurities in silicon by luminescence spectroscopy and synchrotron techniques

Journal of Electronic Materials

Volumn 39, Issue 6, 2010, Pages 787-793

  Schubert, Martin C ^a   Schön, Jonas ^a   Gundel, Paul ^a   Habenicht, Holger ^a   Kwapil, Wolfram ^a   Warta, Wilhelm ^a  

^a FRAUNHOFER INSTITUTE FOR SOLAR ENERGY SYSTEMS ISE   (Germany)

Author keywords

Luminescence; Multicrystalline silicon; Solar cells; Synchrotron; Transition metals

Indexed keywords

IRON; LUMINESCENCE; POINT DEFECTS; POLYSILICON; SILICON SOLAR CELLS; SYNCHROTRONS; TRANSITION METALS;

AFTER HIGH TEMPERATURE; BREAKDOWN SITES; CARRIER RECOMBINATION; LUMINESCENCE SPECTROSCOPY; METAL IMPURITIES; METAL PRECIPITATES; MULTI-CRYSTALLINE SILICON; SYNCHROTRON TECHNIQUES;

SOLAR CELLS;

EID: 77954621962     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-010-1114-7     Document Type: Article

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