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Volumn 94, Issue 9, 2010, Pages 1451-1456

Analysis of performance limiting material properties of multicrystalline silicon

Author keywords

Breakdown; Gettering; Luminescence spectroscopy; Metal impurities; Multicrystalline silicon

Indexed keywords

AFTER HIGH TEMPERATURE; CARRIER LIFETIME MEASUREMENTS; DEFECT LUMINESCENCE; GETTERING; HETEROGENEOUS SYSTEMS; HIGH TEMPERATURE; LUMINESCENCE SPECTROSCOPY; MATERIAL PROPERTY; METAL IMPURITIES; METALLIC IMPURITY; METALLURGICAL-GRADE SILICON; MULTI-CRYSTALLINE SILICON; NUMERICAL SIMULATION; OUT-DIFFUSION; PERFORMANCE LIMITS; PHOSPHORUS DIFFUSION; PREBREAKDOWN; REVERSE BIAS; SPATIALLY RESOLVED; TEMPERATURE STABLE;

EID: 77955424615     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2010.04.010     Document Type: Conference Paper
Times cited : (14)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.