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Volumn 111, Issue 7, 2012, Pages

Capability of photoluminescence for characterization of multi-crystalline silicon

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER LIFETIME MEASUREMENTS; CHARACTERIZATION METHODS; MULTI-CRYSTALLINE SILICON; PHOTOVOLTAIC MATERIALS; SURFACE PASSIVATION; SURFACE RECOMBINATIONS;

EID: 84861730640     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3699275     Document Type: Conference Paper
Times cited : (19)

References (40)
  • 33
    • 0030672719 scopus 로고    scopus 로고
    • 10.1002/(SICI)1099-159X(199701/02)5:1<29::AID-PIP149>3.0.CO;2-M
    • A. G. Aberle and R. Hezel, Prog. Photovoltaics 5, 29 (1997). 10.1002/(SICI)1099-159X(199701/02)5:1<29::AID-PIP149>3.0.CO;2-M
    • (1997) Prog. Photovoltaics , vol.5 , pp. 29
    • Aberle, A.G.1    Hezel, R.2
  • 34
    • 0000005489 scopus 로고
    • 10.1103/PhysRevB.51.4218
    • S. Ogawa and N. Shiono, Phys. Rev. B 51, 4218 (1995). 10.1103/PhysRevB.51.4218
    • (1995) Phys. Rev. B , vol.51 , pp. 4218
    • Ogawa, S.1    Shiono, N.2
  • 40
    • 64749098568 scopus 로고    scopus 로고
    • 10.4028/www.scientific.net/MSF.590.29
    • V. Kveder and M. Kittler, Mater. Sci. Forum 590, 29 (2008). 10.4028/www.scientific.net/MSF.590.29
    • (2008) Mater. Sci. Forum , vol.590 , pp. 29
    • Kveder, V.1    Kittler, M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.