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Journal of Applied Physics

Volumn 108, Issue 3, 2010, Pages

Quantitative carrier lifetime measurement with micron resolution

(5) Gundel, Paul a Heinz, Friedemann D a Schubert, Martin C a Giesecke, Johannes A a Warta, Wilhelm a

a FRAUNHOFER INSTITUTE FOR SOLAR ENERGY SYSTEMS ISE (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER LIFETIME MEASUREMENTS; CONTACT LESS; DIFFUSION LENGTH; HIGH INJECTION; HIGH SPATIAL RESOLUTION; MEASUREMENT METHODS; METAL PRECIPITATES; MICRON RESOLUTION; MICROPHOTOLUMINESCENCE SPECTROSCOPY; MICROSCOPIC DEFECTS; QUANTITATIVE ANALYSIS; QUANTITATIVE TECHNIQUES; SHOCKLEY-READ-HALL; SPATIAL RESOLUTION; SPATIALLY RESOLVED;

GRAIN BOUNDARIES; IMAGE RESOLUTION; SEMICONDUCTING SILICON COMPOUNDS; SILICON WAFERS;

CARRIER LIFETIME;

EID: 77955882461 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3462433 Document Type: Article

Times cited : (53)

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